Non-destructive peak junction temperature measurement of double-chip IGBT modules with temperature inhomogeneity
2021 ◽
Vol 1907
(1)
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pp. 012046
Lei Wei
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Chunsheng Guo
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Hao Guo
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Yunong Liu
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Shiwei Zhang
Sijin Wang
◽
Chunsheng Guo
◽
Boyang Liu
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Lei Wei
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Shiwei Zhang
Kaihong Wang
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Luowei Zhou
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Pengju Sun
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Xiong Du
Nick Baker
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Stig Munk-Nielsen
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Francesco Iannuzzo
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Marco Liserre
Nick Baker
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Stig Munk-Nielsen
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Marco Liserre
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Francesco Iannuzzo
Yulin Zhong
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Chushan Li
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David Xu
2011 ◽
Vol 31
(s1)
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pp. s100313
苗洪利 Miao Hongli
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周晓光 Zhou Xiaoguang
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周长友 Zhou Changyou
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任浩然 Ren Haoran
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田庆震 Tian Qingzhen
Yi Zhang
◽
Huai Wang
◽
Zhongxu Wang
◽
Frede Blaabjerg
Chengmin Li
◽
Zhebie Lu
◽
Han Wu
◽
Wuhua Li
◽
Xiangning He
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...
K R Shailesh
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Ciji Pearl Kurian
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Savitha G Kini
Marco Denk
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Mark-M. Bakran