scholarly journals Variable angle spectroscopic ellipsometric characterization of HfO2thin film

2018 ◽  
Vol 310 ◽  
pp. 012132 ◽  
Author(s):  
M Kumar ◽  
N Kumari ◽  
V Karar ◽  
A L Sharma
Keyword(s):  
Variable Angle ◽  
Ellipsometric Characterization

Infrared ellipsometric characterization of SixNy films on textured Si photovoltaic cells

2008 ◽  
Author(s):  
Mario Fernando. Saenger ◽  
Martin Schädel ◽  
Tino Hofmann ◽  
James Hilfiker ◽  
Jianing Sun ◽  
...  
Keyword(s):  
Photovoltaic Cells ◽  
Ellipsometric Characterization

Ellipsometric characterization of thin films and superlattices

1990 ◽  
Vol 5 (2) ◽  
pp. 285-289 ◽  
Author(s):  
J. Bremer ◽  
O. Hunderi ◽  
Kong Fanping
Keyword(s):  
Thin Films ◽  
Ellipsometric Characterization

Method of ellipsometric characterization of the resist and DBARC interface

2011 ◽  
Author(s):  
Michael Reilly ◽  
James F. Cameron ◽  
Sabrina Wong ◽  
Adam Ware
Keyword(s):  
Ellipsometric Characterization

Ellipsometric characterization of surface freezing in Ga-based alloys

2006 ◽  
Vol 18 (15) ◽  
pp. 3535-3542 ◽  
Author(s):  
K Bartel ◽  
D Nattland ◽  
A Kumar ◽  
S Dogel ◽  
W Freyland
Keyword(s):  
Ellipsometric Characterization ◽  
Surface Freezing
Sign in / Sign up

Export Citation Format

Share Document