Determination of azimuth angle, incidence angle, and contact-potential difference for low-energy electron-diffraction fine-structure measurements
2011 ◽
Vol 23
(43)
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pp. 435001
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1998 ◽
Vol 10
(26)
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pp. 5749-5766
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2003 ◽
Vol 10
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pp. 831-836
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2011 ◽
Vol 82
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pp. 035111
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