scholarly journals Electron-paramagnetic-resonance study of silver-induced defects in silicon

1997 ◽  
Vol 56 (8) ◽  
pp. 4614-4619 ◽  
Author(s):  
P. N. Hai ◽  
T. Gregorkiewicz ◽  
C. A. J. Ammerlaan ◽  
D. T. Don
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