Electron-paramagnetic-resonance study of silver-induced defects in silicon
1997 ◽
Vol 56
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pp. 4614-4619
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P. N. Hai
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T. Gregorkiewicz
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C. A. J. Ammerlaan
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D. T. Don
2002 ◽
Vol 186
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pp. 201-205
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H.J von Bardeleben
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J.L Cantin
2001 ◽
Vol 10
(3-7)
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pp. 993-997
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B.J. Jones
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R.C. Barklie
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R.U.A. Khan
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J.D. Carey
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S.R.P. Silva
2000 ◽
Vol 62
(15)
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pp. 10126-10134
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H. J. von Bardeleben
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J. L. Cantin
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I. Vickridge
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G. Battistig
2008 ◽
Vol 77
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pp. 545-552
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Paul J. Angiolillo
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Nora Graneto
1992 ◽
Vol 1
(Part_2)
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pp. 89-98
Marie Ebersole
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Hans van Willigen
1980 ◽
Vol 255
(17)
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pp. 8116-8120
A. Rodriguez
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G. Tougas
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N. Brisson
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H. Dugas
1966 ◽
Vol 241
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pp. 2256-2259
Stanley Friedman
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Seymour Kaufman
Bin Wang
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Lewis Le Fevre
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Adam Brookfield
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Eric McInnes
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Robert A.W. Dryfe
Cody B. Gale
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Z. Blossom Yan
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Michael Fefer
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Gillian R. Goward
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Michael A. Brook
Victor I. Krinichnyi
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Evgeniya I. Yudanova
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Nikolay N. Denisov
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Aleksei A. Konkin
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Uwe Ritter
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...