Low-energy photoelectron diffraction structure determination of GaSe-bilayer-passivated Si(111)

2001 ◽  
Vol 64 (23) ◽  
Author(s):  
Shuang Meng ◽  
B.R. Schroeder ◽  
A. Bostwick ◽  
Marjorie A. Olmstead ◽  
Eli Rotenberg ◽  
...  
2001 ◽  
Vol 492 (1-2) ◽  
pp. 1-10 ◽  
Author(s):  
J.T. Hoeft ◽  
M. Polcik ◽  
M. Kittel ◽  
R. Terborg ◽  
R.L. Toomes ◽  
...  

2014 ◽  
Vol 50 (88) ◽  
pp. 13571-13574 ◽  
Author(s):  
Luis Henrique de Lima ◽  
Dominique Handschak ◽  
Frank Schönbohm ◽  
Richard Landers ◽  
Carsten Westphal ◽  
...  

A chemical-specific photoelectron diffraction structure determination of a carbon rich buffer layer on SiC is reported.


2009 ◽  
Vol 603 (16) ◽  
pp. 2658-2663 ◽  
Author(s):  
K.-M. Schindler ◽  
J. Wang ◽  
A. Chassé ◽  
H. Neddermeyer ◽  
W. Widdra

2006 ◽  
Vol 14 (2-3) ◽  
pp. 279-285 ◽  
Author(s):  
R. J. Papoular ◽  
H. Allouchi ◽  
A. V. Dzyabchenko ◽  
V. A. Davydov ◽  
A. V. Rakhmanina ◽  
...  

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