Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron light
2007 ◽
Vol 156-158
◽
pp. 92-96
◽
Keyword(s):
1997 ◽
Vol 9
(40)
◽
pp. 8419-8432
◽
1990 ◽
pp. 101
◽