Determination of Debye–Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientations
2010 ◽
Vol 66
(6)
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pp. 685-693
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1993 ◽
Vol 51
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pp. 688-689
2010 ◽
Vol 16
(S2)
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pp. 938-939
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1995 ◽
Vol 36
(11)
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pp. 1344-1348
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1999 ◽
Vol 55
(2)
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pp. 188-196
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2002 ◽
Vol 382
(4)
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pp. 422-430
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