Microscopy of Semiconducting Materials 2003
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Published By CRC Press

9781351074636
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Investigations of bonding at an aluminium (III) oxide membrane in Si using ELNES separation

2018 ◽  
pp. 401-404
Author(s):  
M Stöger-Pollach ◽  
P Schattschneider ◽  
J Schneider ◽  
S Gall ◽  
H W Zandbergen
Keyword(s):  
Oxide Membrane

Quantitative TEM analysis of structural defects in helium implanted silicon

2018 ◽  
pp. 373-378
Author(s):  
N Hueging ◽  
K Tillmann ◽  
M Luysberg ◽  
H Trinkaus ◽  
K Urban
Keyword(s):  
Structural Defects ◽  
Tem Analysis

Investigations of core level states in epitaxial grown Si layers by electron energy loss spectrometry

2018 ◽  
pp. 37-40
Author(s):  
M Stöger-Pollach ◽  
C Hébert ◽  
E C Karl-Rückert ◽  
P Schattschneider ◽  
B Rau ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Core Level ◽  
Electron Energy Loss Spectrometry ◽  
Electron Energy Loss

Microstructure and optical properties of ELO-GaN layers grown by hydride vapor phase epitaxy

2018 ◽  
pp. 321-324
Author(s):  
S Gradecak ◽  
M Albrecht ◽  
H P Strunk ◽  
D Martin ◽  
J Napierala ◽  
...  
Keyword(s):  
Optical Properties ◽  
Vapor Phase ◽  
Vapor Phase Epitaxy ◽  
Hydride Vapor Phase Epitaxy
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