scholarly journals A Digital-Twin-Assisted Fault Diagnosis Using Deep Transfer Learning

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 19990-19999 ◽  
Author(s):  
Yan Xu ◽  
Yanming Sun ◽  
Xiaolong Liu ◽  
Yonghua Zheng
Author(s):  
Min Xia ◽  
Haidong Shao ◽  
Darren Williams ◽  
Siliang Lu ◽  
Lei Shu ◽  
...  

2021 ◽  
Vol 103 ◽  
pp. 107150
Author(s):  
Te Han ◽  
Chao Liu ◽  
Rui Wu ◽  
Dongxiang Jiang

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