Blind Calibration for Sparse Regression: A State Evolution Analysis

2019 ◽  
Author(s):  
Marylou Gabrie ◽  
Jean Barbier ◽  
Florent Krzakala ◽  
Lenka Zdeborova
Keyword(s):  
Sparse Regression ◽  
Evolution Analysis ◽  
State Evolution ◽  
Blind Calibration

scholarly journals Blind calibration for compressed sensing: state evolution and an online algorithm

2020 ◽  
Vol 53 (33) ◽  
pp. 334004
Author(s):  
Marylou Gabrié ◽  
Jean Barbier ◽  
Florent Krzakala ◽  
Lenka Zdeborová
Keyword(s):  
Compressed Sensing ◽  
Online Algorithm ◽  
State Evolution ◽  
Blind Calibration

Sparse Regression Codes

2019 ◽  
Author(s):  
Ranmji Venkataramanan ◽  
Sekhar Tatikonda ◽  
Andrew Barron
Keyword(s):  
Sparse Regression

Evolution Analysis of Data Flow Oriented Internetware Service

2014 ◽  
Vol 24 (12) ◽  
pp. 2797-2813 ◽  
Author(s):  
Min SONG ◽  
Zheng-Xian WEI ◽  
Gui-Sheng YIN
Keyword(s):  
Data Flow ◽  
Evolution Analysis

scholarly journals Trophic State Evolution over 15 Years in a Tropical Reservoir with Low Nitrogen Concentrations and Cyanobacteria Predominance

2016 ◽  
Vol 227 (3) ◽  
Author(s):  
Frederico Guilherme de Souza Beghelli ◽  
Daniele Frascareli ◽  
Marcelo Luiz Martins Pompêo ◽  
Viviane Moschini-Carlos
Keyword(s):  
Trophic State ◽  
Tropical Reservoir ◽  
State Evolution ◽  
Nitrogen Concentrations ◽  
Low Nitrogen

Extraction and Evolution Analysis of Urban Built-Up Areas in Beijing, 1984–2018

2021 ◽  
Author(s):  
C. L. Yin ◽  
F. Meng ◽  
L. Guo ◽  
Y. X. Zhang ◽  
Z. Zhao ◽  
...  
Keyword(s):  
Evolution Analysis

scholarly journals Resistance state evolution under constant electric stress on a MoS2 non-volatile resistive switching device

RSC Advances ◽  
2020 ◽  
Vol 10 (69) ◽  
pp. 42249-42255
Author(s):  
Xiaohan Wu ◽  
Ruijing Ge ◽  
Yifu Huang ◽  
Deji Akinwande ◽  
Jack C. Lee
Keyword(s):  
Resistive Switching ◽  
Constant Voltage ◽  
Switching Device ◽  
Current Stress ◽  
Electric Stress ◽  
State Evolution ◽  
Conductive Bridge ◽  
Resistance State ◽  
Switching Devices

Constant voltage and current stress were applied on MoS2 resistive switching devices, showing unique behaviors explained by a modified conductive-bridge-like model.

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