Defect recognition via longitudinal mode analysis of high power broad area QW semiconductor lasers

Author(s):  
A. Klehr ◽  
G. Beister ◽  
G. Erbert ◽  
A. Klein ◽  
A. Knauer ◽  
...  
2001 ◽  
Vol 90 (1) ◽  
pp. 43-47 ◽  
Author(s):  
A. Klehr ◽  
G. Beister ◽  
G. Erbert ◽  
A. Klein ◽  
J. Maege ◽  
...  

2019 ◽  
Vol 51 (3) ◽  
Author(s):  
Mindaugas Radziunas ◽  
Jürgen Fuhrmann ◽  
Anissa Zeghuzi ◽  
Hans-Jürgen Wünsche ◽  
Thomas Koprucki ◽  
...  

2019 ◽  
Vol 25 (6) ◽  
pp. 1-10 ◽  
Author(s):  
Anissa Zeghuzi ◽  
Hans-Jurgen Wunsche ◽  
Hans Wenzel ◽  
Mindaugas Radziunas ◽  
Jurgen Fuhrmann ◽  
...  

2014 ◽  
Vol 2014 ◽  
pp. 1-5
Author(s):  
Christoph Doering ◽  
Henning Fouckhardt

Experimental results of the combination of transverse mode selection and active mode-locking with anti-reflection-coated broad area lasers (BALs) are presented. The BALs are subject to feedback from a free-space external Fourier-optical 4f-setup with a reflective spatial frequency filter in the Fourier-plane for transverse mode selection. Driving the BALs with a high frequency modulated pump current above threshold active longitudinal mode-locking is achieved. Pulse durations as low as 88 ps are obtained, while the Gaussian-like fundamental or a higher order transverse mode up to mode number 5 is selected on purpose. Pulse duration and shape are nearly independent of the selected transverse mode.


2009 ◽  
Vol 94 (1) ◽  
pp. 011107 ◽  
Author(s):  
Chen Chen ◽  
Paul Leisher ◽  
Steve Patterson ◽  
Paul Crump ◽  
Yong Kwan Kim ◽  
...  

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