3-D interpretation of single line drawings based on entropy minimization principle

2005 ◽  
Author(s):  
K. Shoji ◽  
K. Kato ◽  
F. Toyama
Keyword(s):  
Single Line ◽  
Minimization Principle ◽  
Line Drawings ◽  
Entropy Minimization

scholarly journals Calibration of Linear Time-Varying Frequency Errors for Distributed ISAR Imaging Based on the Entropy Minimization Principle

Sensors ◽  
2019 ◽  
Vol 19 (6) ◽  
pp. 1323 ◽  
Author(s):  
Hailong Kang ◽  
Jun Li ◽  
Hongyan Zhao ◽  
Zhiyu Bao ◽  
Zehua Yu
Keyword(s):  
Cost Function ◽  
Linear Time ◽  
Solution Space ◽  
Function Optimization ◽  
Frequency Error ◽  
Time Varying ◽  
Minimization Principle ◽  
Entropy Minimization ◽  
Error Coefficient ◽  
Time Varying Frequency

The inevitable frequency errors owing to the frequency mismatch of a transmitter and receiver oscillators could seriously deteriorate the imaging performance in distributed inverse synthetic aperture radar (ISAR) system. In this paper, for this issue, a novel method is proposed to calibrate the linear time-varying frequency errors (LTFE) between the transmitting node and the receiving node. The cost function is constructed based on the entropy minimization principle and the problem of LTFE calibration is transformed into cost function optimization. The frequency error coefficient, which minimizes the image entropy, is obtained by searching optimum solution in the solution space of cost function. Then, the original signal is calibrated by the frequency error coefficient. Finally, the effectiveness of the proposed method is demonstrated by simulation and real-data experiments.

Tandem scanning reflected light microscopy: How it works and applications

1986 ◽  
Vol 44 ◽  
pp. 84-87
Author(s):  
Alan Boyde ◽  
Milan Hadravský ◽  
Mojmír Petran ◽  
Timothy F. Watson ◽  
Sheila J. Jones ◽  
...  
Keyword(s):  
Light Microscopy ◽  
Focal Plane ◽  
Central Symmetry ◽  
Single Line ◽  
Scanning Microscope ◽  
Reflected Light ◽  
Illuminating Light ◽  
Illuminating Beam

The principles of tandem scanning reflected light microscopy and the design of recent instruments are fully described elsewhere and here only briefly. The illuminating light is intercepted by a rotating aperture disc which lies in the intermediate focal plane of a standard LM objective. This device provides an array of separate scanning beams which light up corresponding patches in the plane of focus more intensely than out of focus layers. Reflected light from these patches is imaged on to a matching array of apertures on the opposite side of the same aperture disc and which are scanning in the focal plane of the eyepiece. An arrangement of mirrors converts the central symmetry of the disc into congruency, so that the array of apertures which chop the illuminating beam is identical with the array on the observation side. Thus both illumination and “detection” are scanned in tandem, giving rise to the name Tandem Scanning Microscope (TSM). The apertures are arranged on Archimedean spirals: each opposed pair scans a single line in the image.

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