DirectFuzz: Automated Test Generation for RTL Designs using Directed Graybox Fuzzing

Mapping Intimacies ◽

10.1109/dac18074.2021.9586289 ◽

2021 ◽

Author(s):

Sadullah Canakci ◽

Leila Delshadtehrani ◽

Furkan Eris ◽

Michael Bedford Taylor ◽

Manuel Egele ◽

...

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

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Automated test generation for OpenCL kernels using fuzzing and constraint solving

Proceedings of the 13th Annual Workshop on General Purpose Processing using Graphics Processing Unit ◽

10.1145/3366428.3380768 ◽

2020 ◽

Author(s):

Chao Peng ◽

Ajitha Rajan

Keyword(s):

Test Generation ◽

Constraint Solving ◽

Automated Test Generation ◽

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The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_5 ◽

2002 ◽

pp. 71-90 ◽

Author(s):

Erik Jan Marinissen

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

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Automated Test Generation and Verified Software

Verified Software: Theories, Tools, Experiments - Lecture Notes in Computer Science ◽

10.1007/978-3-540-69149-5_18 ◽

2008 ◽

pp. 161-172 ◽

Author(s):

John Rushby

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

Automated Test ◽

Verified Software

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Data driven architecture based automated test generation for Android mobile

2015 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC) ◽

10.1109/iccic.2015.7435772 ◽

2015 ◽

Author(s):

R Anbunathan ◽

Anirban Basu

Keyword(s):

Test Generation ◽

Data Driven ◽

Automated Test Generation ◽

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Visual Requirements Specification and Automated Test Generation for Digital Applications

2015 IEEE/ACM 2nd International Workshop on Requirements Engineering and Testing ◽

10.1109/ret.2015.15 ◽

2015 ◽

Author(s):

Kapil Singi ◽

Vikrant Kaulgud ◽

Dipin Era

Keyword(s):

Test Generation ◽

Requirements Specification ◽

Automated Test Generation ◽

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Automated Test Generation for Debugging Arithmetic Circuits

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.3850/9783981537079_0823 ◽

2016 ◽

Author(s):

Farimah Farahmandi ◽

Prabhat Mishra

Keyword(s):

Test Generation ◽

Arithmetic Circuits ◽

Automated Test Generation ◽

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Requirements traceability in automated test generation

ACM SIGSOFT Software Engineering Notes ◽

10.1145/1082983.1083282 ◽

2005 ◽

Vol 30 (4) ◽

pp. 1-7 ◽

Author(s):

F. Bouquet ◽

E. Jaffuel ◽

B. Legeard ◽

F. Peureux ◽

M. Utting

Keyword(s):

Test Generation ◽

Requirements Traceability ◽

Automated Test Generation ◽

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Pex4Fun: A web-based environment for educational gaming via automated test generation

2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE) ◽

10.1109/ase.2013.6693144 ◽

2013 ◽

Author(s):

Nikolai Tillmann ◽

Jonathan de Halleux ◽

Tao Xie ◽

Judith Bishop

Keyword(s):

Test Generation ◽

Web Based ◽

Educational Gaming ◽

Automated Test Generation ◽

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Automated test generation from object-oriented specifications of real-time reactive systems

Tenth Asia-Pacific Software Engineering Conference, 2003. ◽

10.1109/apsec.2003.1254396 ◽

2004 ◽

Author(s):

V.S. Alagar ◽

M. Chen ◽

O. Ormandjieva ◽

M. Zheng

Keyword(s):

Real Time ◽

Test Generation ◽

Reactive Systems ◽

Object Oriented ◽

Automated Test Generation ◽

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Automated test generation for engineering applications

Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering - ASE '05 ◽

10.1145/1101908.1101951 ◽

2005 ◽

Author(s):

Songtao Xia ◽

Ben Di Vito ◽

César Muñoz

Keyword(s):

Test Generation ◽

Engineering Applications ◽

Automated Test Generation ◽

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