SH-wave scattering by elastic inclusion with a thin interface layer of low rigidity

Author(s):  
Yaroslav I. Kunets ◽  
Valeriy V. Matus ◽  
Viktor O. Mishchenko ◽  
Vasyl V. Porochovs'kyj
2017 ◽  
Vol 5 (1) ◽  
pp. 45-50
Author(s):  
Myron Voytko ◽  
◽  
Yaroslav Kulynych ◽  
Dozyslav Kuryliak

The problem of the elastic SH-wave diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The solution is obtained by the Wiener- Hopf method. The dependences of the scattered field on the structure parameters are presented in analytical form. Verifica¬tion of the obtained solution is presented.


2019 ◽  
Vol 2019 ◽  
pp. 1-8 ◽  
Author(s):  
Hongmei Wu

This paper focuses on analyzing SH-wave scattering around a circular nanoinclusion using the complex variable function method. The surface elasticity theory is employed in the analysis to account for the interface effect at the nanoscale. Considering the interface effect, the boundary condition is given, and the infinite algebraic equations are established to solve the unknown coefficients of the scattered and refracted wave solutions. The analytic solutions of the stress field are obtained by using the orthogonality of trigonometric function. Finally, the dynamic stress concentration factor and the radial stress of a circular nanoinclusion are analyzed with some numerical results. The numerical results show that the interface effect weakens the dynamic stress concentration but enhances the radial stress around the nanoinclusion; further, we prove that the analytic solutions are correct.


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