Hyperspectral Image Analysis for Automatic Detection and Discrimination of Residual Manufacturing Contaminants

Author(s):  
Ava Vali ◽  
Philipp Kramer ◽  
Rainer Strzoda ◽  
Sara Comai ◽  
Alexander M. Gigler ◽  
...  
IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Uzair Khan ◽  
Sidike Paheding ◽  
Colin Elkin ◽  
Vijay Devabhaktuni

2005 ◽  
Author(s):  
Samuel Rosario-Torres ◽  
Emmanuel Arzuaga-Cruz ◽  
Miguel Velez-Reyes ◽  
Luis O. Jimenez-Rodriguez

2016 ◽  
Vol 73 (1) ◽  
pp. 514-529 ◽  
Author(s):  
Juan Mario Haut ◽  
Mercedes Paoletti ◽  
Javier Plaza ◽  
Antonio Plaza

Author(s):  
M. Ferreiro-Armán ◽  
J. -P. Da Costa ◽  
S. Homayouni ◽  
J. Martín-Herrero

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