An object contour extraction using local structure information captured by a spotlight filter

2012 ◽  
Author(s):  
Cheng-Ting Liu ◽  
Chih-Chuan Lin ◽  
Roy Chaoming Hsu
Keyword(s):  
Local Structure ◽  
Contour Extraction ◽  
Structure Information ◽  
Object Contour

Optimizing complex networks controllability by local structure information

2016 ◽  
Vol 27 (10) ◽  
pp. 1650115
Author(s):  
Houyi Yan ◽  
Lvlin Hou ◽  
Yunxiang Ling ◽  
Guohua Wu
Keyword(s):  
Numerical Simulation ◽  
Complex Networks ◽  
Network Structure ◽  
Local Structure ◽  
Global Structure ◽  
Directed Network ◽  
Structure Information ◽  
Different Types ◽  
Extensive Numerical Simulation ◽  
Network Controllability

Research in network controllability has mostly been focused on the effects of the network structure on its controllability, and some methods have been proposed to optimize the network controllability. However, they are all based on global structure information of networks. We propose two different types of methods to optimize controllability of a directed network by local structure information. Extensive numerical simulation on many modeled networks demonstrates that this method is effective. Since the whole topologies of many real networks are not visible and we only get some local structure information, this strategy is potentially more practical.

scholarly journals Local structure analysis of amorphous materials by angstrom-beam electron diffraction

Microscopy ◽  
2020 ◽  
Author(s):  
Akihiko Hirata
Keyword(s):  
Electron Diffraction ◽  
Structure Analysis ◽  
Local Structure ◽  
Amorphous Materials ◽  
Rotational Symmetry ◽  
Diffraction Method ◽  
Beam Electron ◽  
Structure Information ◽  
Amorphous Structures ◽  
Global And Local

Abstract The structure analysis of amorphous materials still leaves much room for improvement. Owing to the lack of translational or rotational symmetry of amorphous materials, it is important to develop a different approach from that used for crystals for the structure analysis of amorphous materials. Here, the angstrom-beam electron diffraction method was used to obtain the local structure information of amorphous materials at a sub-nanometre scale. In addition, we discussed the relationship between the global and local diffraction intensities of amorphous structures, and verified the effectiveness of the proposed method through basic diffraction simulations. Finally, some applications of the proposed method to structural and functional amorphous materials are summarized.

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