Cachecompress: a novel approach for test data compression with cache for IP embedded cores

2007 IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.2007.4397315 ◽

2007 ◽

Author(s):

Hao Fang ◽

Chenguang Tong ◽

Bo Yao ◽

Xiaodi Song ◽

Xu Cheng

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Novel Approach ◽

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Test data compression technique for embedded cores using virtual scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2004.830911 ◽

2004 ◽

Vol 12 (7) ◽

pp. 775-781 ◽

Author(s):

A. Jas ◽

B. Pouya ◽

N.A. Touba

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Embedded Cores ◽

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RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

2007 Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2007.358074 ◽

2007 ◽

Author(s):

Hao Fang ◽

Chenguang Tong ◽

Xu Cheng

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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Test-data compression using hybrid prefix encoding for testing embedded cores

2010 3rd International Conference on Computer Science and Information Technology ◽

10.1109/iccsit.2010.5564956 ◽

2010 ◽

Author(s):

Ling Zhang ◽

Ji-shun Kuang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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Test data compression for ip embedded cores using selective encoding of scan slices

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584019 ◽

2006 ◽

Author(s):

Zhanglei Wang ◽

K. Chakrabarty

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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Test data compression using interval broadcast scan for embedded cores

Microelectronics Journal ◽

10.1016/j.mejo.2011.09.003 ◽

2011 ◽

Vol 42 (11) ◽

pp. 1313-1319 ◽

Author(s):

Ling Zhang ◽

Ji-shun Kuang ◽

Zhiq-qiang You

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers

IEEE Design and Test ◽

10.1109/mdat.2015.2424422 ◽

2015 ◽

Vol 32 (4) ◽

pp. 40-48 ◽

Author(s):

Christos Papameletis ◽

Brion Keller ◽

Vivek Chickermane ◽

Said Hamdioui ◽

Erik Jan Marinissen

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

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A Novel Approach to Drastic Test Data Compression for Multiple Scan Designs

2007 2nd IEEE Conference on Industrial Electronics and Applications ◽

10.1109/iciea.2007.4318693 ◽

2007 ◽

Author(s):

Jing-bo Shao ◽

Tao Zhou ◽

Guang-sheng Ma

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Novel Approach ◽

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Split variable-length input Huffman code with application to test data compression for embedded cores in SOCs

International Journal of Electronics ◽

10.1080/00207210902876461 ◽

2009 ◽

Vol 96 (9) ◽

pp. 935-942 ◽

Author(s):

Chandan Giri ◽

B. Mallikarjuna Rao ◽

Santanu Chattopadhyay

Keyword(s):

Data Compression ◽

Test Data ◽

Variable Length ◽

Huffman Code ◽

Test Data Compression ◽

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A Test Data Compression Scheme Based on Mixed Fixed and Variable Length Coding

Chinese Journal of Computers ◽

10.3724/sp.j.1016.2008.01826 ◽

2009 ◽

Vol 31 (10) ◽

pp. 1826-1834 ◽

Author(s):

Wen-Fa ZHAN ◽

Hua-Guo LIANG ◽

Feng SHI ◽

Zheng-Feng HUANG

Keyword(s):

Data Compression ◽

Test Data ◽

Variable Length ◽

Test Data Compression ◽

Compression Scheme ◽

Variable Length Coding

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Test data compression of system-on-a-chip (SoC) based on partial runs reversing

JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT ◽

10.3724/sp.j.1187.2010.00023 ◽

2010 ◽

Vol 24 (1) ◽

pp. 23-28

Author(s):

Yiming Ouyang ◽

Baosheng Zou ◽

Huaguo Liang ◽

Xi’e Huang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

System On A Chip

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