IEEE International Conference on Test, 2005.
Latest Publications

TOTAL DOCUMENTS

181

(FIVE YEARS 0)

H-INDEX

20

(FIVE YEARS 0)

Published By IEEE

0780390385

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A static noise impact analysis methodology for evaluating transient error effects in digital VLSI circuits

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584071 ◽

2006 ◽

Author(s):

Chong Zhao ◽

Xiaoliang Bai ◽

S. Dey

Keyword(s):

Impact Analysis ◽

Vlsi Circuits ◽

Digital Vlsi ◽

Analysis Methodology ◽

Noise Impact ◽

Transient Error ◽

Static Noise

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A new approach for massive parallel scan design

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584010 ◽

2006 ◽

Cited By ~ 4

Author(s):

Woo Cheol Chung ◽

Dong Sam Ha

Keyword(s):

Scan Design ◽

New Approach ◽

Parallel Scan

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A vector-based approach for power supply noise analysis in test compaction

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584012 ◽

2006 ◽

Cited By ~ 11

Author(s):

Jing Wang ◽

Ziding Yue ◽

Xiang Lu ◽

Wangqi Qiu ◽

Weiping Shi ◽

...

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Power Supply Noise ◽

Test Compaction ◽

Supply Noise

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A new probing technique for high-speed/high-density printed circuit boards

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584094 ◽

2006 ◽

Author(s):

K.P. Parker

Keyword(s):

High Speed ◽

Printed Circuit Boards ◽

High Density ◽

Circuit Boards ◽

Printed Circuit

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Position statement: "have we overcome the challenges associated with soc and multi-core testing?"

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584119 ◽

2006 ◽

Cited By ~ 3

Author(s):

T. Wood

Keyword(s):

Position Statement

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Evaluating ate-equipment for volume diagnosis

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584073 ◽

2006 ◽

Cited By ~ 6

Author(s):

R. Arnold ◽

A. Leininger

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Functional vs. multi-VDD testing of RF circuits

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584000 ◽

2006 ◽

Cited By ~ 13

Author(s):

E. Silva ◽

J. Pineda de Gyvez ◽

G. Gronthoud

Keyword(s):

Rf Circuits

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Defect-oriented testing and diagnosis of digital microfluidicsbased biochips

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584009 ◽

2006 ◽

Cited By ~ 1

Author(s):

Fei Su ◽

W. Hwang ◽

A. Mukherjee ◽

K. Chakrabarty

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Calibrating clock stretch during AC scan testing

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1583984 ◽

2006 ◽

Cited By ~ 42

Author(s):

J. Rearick ◽

R. Rodgers

Keyword(s):

Scan Testing

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Panel discussion for "have we overcome the challenges associated with soc and multi-core testing?"

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584117 ◽

2006 ◽

Author(s):

N. Chelstrom

Keyword(s):

Panel Discussion

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