Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits

Author(s):  
N. Nagi ◽  
J. A. Abraham
Author(s):  
Avinash H. Hedaoo ◽  
◽  
Abha Khandelwal ◽  

Author(s):  
David Walter ◽  
Scott Little ◽  
Chris Myers ◽  
Nicholas Seegmiller ◽  
Tomohiro Yoneda

2010 ◽  
Vol 26 (1) ◽  
pp. 73-86 ◽  
Author(s):  
Hongjoong Shin ◽  
Joonsung Park ◽  
Jacob A. Abraham

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