Process parameter calibration for millimeter-wave CMOS back-end device design with electromagnetic field analysis

Author(s):  
S. Amakawa ◽  
A. Orii ◽  
K. Katayama ◽  
K. Takano ◽  
M. Motoyoshi ◽  
...  
1993 ◽  
Vol 3 (3) ◽  
pp. 363-371 ◽  
Author(s):  
A. Konrad ◽  
I. A. Tsukerman

2002 ◽  
Vol 22 (8) ◽  
pp. 72-72
Author(s):  
T. Mozumi ◽  
Y. Baba ◽  
M. Ishii ◽  
N. Nagaoka ◽  
A. Ametani

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