2014 International Conference on Microelectronic Test Structures (ICMTS)
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45

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4

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Published By IEEE

9781479921928, 9781479921935

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

On wafer silicon integrated noise source characterization up to 110 GHz based on Germanium-on-Silicon photodiode

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841484 ◽

2014 ◽

Author(s):

S. Oeuvrard ◽

J.-F. Lampin ◽

G. Ducournau ◽

S. Lepilliet ◽

F. Danneville ◽

...

Keyword(s):

Noise Source ◽

Source Characterization ◽

Silicon Photodiode

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Characterization and development of materials for an integrated high-temperature sensor using resistive test structures

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841491 ◽

2014 ◽

Author(s):

A. Tabasnikov ◽

A. S. Bunting ◽

J. G. Terry ◽

J. Murray ◽

G. Cummins ◽

...

Keyword(s):

High Temperature ◽

Temperature Sensor ◽

High Temperature Sensor

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Common-floating gate test structure for separation of cycling-induced degradation components in split-gate flash memory cells

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841465 ◽

2014 ◽

Author(s):

Nhan Do ◽

Yuri Tkachev

Keyword(s):

Flash Memory ◽

Test Structure ◽

Floating Gate ◽

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Characterisation of residual stress in dielectric films studied by automated wafer mapping

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841475 ◽

2014 ◽

Author(s):

R. Walker ◽

E. Sirotkin ◽

G. Schiavone ◽

J. G. Terry ◽

S. Smith ◽

...

Keyword(s):

Residual Stress ◽

Dielectric Films

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Calibration methods for silicon nanowire BioFETs

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841493 ◽

2014 ◽

Author(s):

Aleksandar Vacic ◽

Jason M Criscione ◽

Eric Stern ◽

Nitin K Rajan ◽

Tarek Fahmy ◽

...

Keyword(s):

Silicon Nanowire ◽

Calibration Methods

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Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841460 ◽

2014 ◽

Author(s):

O. Nier ◽

D. Rideau ◽

A. Cros ◽

F Monsieur ◽

G. Ghibaudo ◽

...

Keyword(s):

Effective Field ◽

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Process parameter calibration for millimeter-wave CMOS back-end device design with electromagnetic field analysis

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841490 ◽

2014 ◽

Author(s):

S. Amakawa ◽

A. Orii ◽

K. Katayama ◽

K. Takano ◽

M. Motoyoshi ◽

...

Keyword(s):

Electromagnetic Field ◽

Millimeter Wave ◽

Process Parameter ◽

Field Analysis ◽

Device Design ◽

Parameter Calibration

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A compact array for characterizing 32k transistors in wafer scribe lanes

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841497 ◽

2014 ◽

Author(s):

Christopher S. Chen ◽

Liping Lil ◽

Queennie Lim ◽

Hong Hai Teh ◽

Noor Fadillah Binti Omar ◽

...

Keyword(s):

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Accurate modeling of dynamic variability of SRAM cell in 28 nm FDSOI technology

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841466 ◽

2014 ◽

Author(s):

J. El Husseini ◽

A. Subirats ◽

X. Garros ◽

A. Makoseij ◽

O. Thomas ◽

...

Keyword(s):

Sram Cell ◽

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Front matter

2014 International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2014.6841457 ◽

2014 ◽

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