Reliability of integrated resistors and the influence of WLCSP bake

Author(s):  
S. Jose ◽  
J. Bisschop ◽  
V. Girault ◽  
L. v. Marwijk ◽  
J. Zhang ◽  
...  
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1999 ◽  
Vol 6 (10-12) ◽  
pp. 547-551 ◽  
Author(s):  
M Biehl ◽  
E Crocoll ◽  
M Neuhaus ◽  
T Scherer ◽  
W Jutzi

2020 ◽  
Vol 65 (11) ◽  
pp. 1777-1779
Author(s):  
B. A. Gurovich ◽  
K. E. Prikhod’ko ◽  
B. V. Goncharov ◽  
M. M. Dement’eva ◽  
L. V. Kutuzov ◽  
...  

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