Characterization of the Impairment and Recovery of GaN-HEMTs in Low-Noise Amplifiers under Input Overdrive
2017 ◽
Vol 38
(7)
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pp. 926-928
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2003 ◽
Vol 52
(5)
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pp. 1606-1610
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2004 ◽
Vol 14
(6)
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pp. 259-261
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Keyword(s):
2004 ◽
Vol 52
(9)
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pp. 2153-2162
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2018 ◽
Vol 18
(4)
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pp. 613-619
2016 ◽
Vol 64
(11)
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pp. 3631-3642
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