Chemical Analysis Tools for Rapid Determination of Postmortem Interval On-Site: Application of Smart City Principles to Forensic Science

Author(s):  
Cecilia E. Ramirez ◽  
Juan Manuel Viveros Paredes ◽  
Edgardo Flores Torales ◽  
Hector Perez Ladron de Guevara ◽  
Jorge Ivan Delgado Saucedo ◽  
...  
2018 ◽  
Vol 10 (40) ◽  
pp. 4879-4885 ◽  
Author(s):  
Song Ye ◽  
Xiao Chen ◽  
Daming Dong ◽  
Jiejun Wang ◽  
Xinqiang Wang ◽  
...  

Chemical oxygen demand (COD) is a water quality indicator that is typically measured by lengthy chemical analysis methods in the laboratory, which indicates that obtaining rapid results is difficult.


Author(s):  
J. Adam Watson

The rapid determination of the chemical elements present in a mineral has been a desideratum ever since minerals became of economic use. Various methods have been employed, starting with blowpipe work, which in the early days proved of great value, especially in experienced hands, With the development of chemistry and the discovery of new elements, this process was largely abandoned in favour of the standard ' wet method' of chemical analysis. Later on, micro-chemical reactions came into limited employment. Here the appearance of easily crystallizable salts under the microscope was used for diagnostic purposes. This method has been extensively examined of late years and became so overloaded with precautions that its chief asset, that of rapidity and case of employment, has been largely lost. Quite recently colorimetric reactions have been applied to qualitative analysis. These appeared so promising that the present author was encouraged to endeavour to apply them to the examination of minerals.A scheme for the qualitative determination of the commoner elements was published by G. Gutzeit in 1929, which at first sight looked very attractive.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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