System Calibration and Statistical Image Reconstruction for Sub-mm Stationary Pinhole SPECT

Author(s):  
F. van der Have ◽  
B. Vastenhouw ◽  
M. Rentmeester ◽  
F.J. Beekman
2004 ◽  
Vol 1265 ◽  
pp. 101-105
Author(s):  
Tsutomu Zeniya ◽  
Hiroshi Watabe ◽  
Toshiyuki Aoi ◽  
Kyeong Min Kim ◽  
Noboru Teramoto ◽  
...  

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