A Comprehensive Analysis of Error Sources in Electronic Fully Digital Impedance Bridges

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2020.3034115 ◽

2021 ◽

Vol 70 ◽

pp. 1-14 ◽

Author(s):

Massimo Ortolano ◽

Martina Marzano ◽

Vincenzo D'Elia ◽

Ngoc Thanh Mai Tran ◽

Ryszard Rybski ◽

...

Keyword(s):

Comprehensive Analysis ◽

Error Sources ◽

Analysis Of Error

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Analysis of Error Sources Towards Improved Form Processing

9th International Conference on Information Technology (ICIT'06) ◽

10.1109/icit.2006.30 ◽

2006 ◽

Author(s):

Ujjwal Bhattacharya ◽

Bikash Shaw ◽

Swapan K. Parui

Keyword(s):

Error Sources ◽

Form Processing ◽

Analysis Of Error

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Small Atomic Orbital Basis Set First‐Principles Quantum Chemical Methods for Large Molecular and Periodic Systems: A Critical Analysis of Error Sources

ChemistryOpen ◽

10.1002/open.201500192 ◽

2015 ◽

Vol 5 (2) ◽

pp. 94-109 ◽

Author(s):

Rebecca Sure ◽

Jan Gerit Brandenburg ◽

Stefan Grimme

Keyword(s):

First Principles ◽

Quantum Chemical ◽

Critical Analysis ◽

Atomic Orbital ◽

Basis Set ◽

Periodic Systems ◽

Chemical Methods ◽

Error Sources ◽

Quantum Chemical Methods ◽

Analysis Of Error

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An Analysis of Error Sources and Reliability Estimation in Creativity Assessment of Young Children Using Generalizability Theory

Asia-pacific Journal of Multimedia services convergent with Art Humanities and Sociology ◽

10.14257/ajmahs.2016.09.10 ◽

2016 ◽

Vol 6 (9) ◽

pp. 287-296

Author(s):

Younchul Choi ◽

Kyung Chul Kim

Keyword(s):

Young Children ◽

Generalizability Theory ◽

Reliability Estimation ◽

Error Sources ◽

Creativity Assessment ◽

Analysis Of Error

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Eye-gaze systems - An analysis of error sources and potential accuracy in consumer electronics use cases

2016 IEEE International Conference on Consumer Electronics (ICCE) ◽

10.1109/icce.2016.7430628 ◽

2016 ◽

Author(s):

Anuradha Kar ◽

Shabab Bazrafkan ◽

Claudia C Ostache ◽

Peter Corcoran

Keyword(s):

Eye Gaze ◽

Consumer Electronics ◽

Use Cases ◽

Error Sources ◽

Potential Accuracy ◽

Analysis Of Error

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Analysis of error sources on orbital atomic clocks’ stability

Geo-spatial Information Science ◽

10.1080/10095020.2012.720458 ◽

2012 ◽

Vol 15 (3) ◽

pp. 207-211

Author(s):

Yue MAO ◽

Jianpeng CHEN ◽

Wei DAI ◽

Xiaolin JIA

Keyword(s):

Atomic Clocks ◽

Error Sources ◽

Analysis Of Error

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An analysis of error sources and reliability estimation in self-control assessment of young children using generalizability theory

Journal of the Korea Academia-Industrial cooperation Society ◽

10.5762/kais.2016.17.11.507 ◽

2016 ◽

Vol 17 (11) ◽

pp. 507-512

Author(s):

Younchul Choi ◽

Kyung-Chul Kim

Keyword(s):

Young Children ◽

Generalizability Theory ◽

Reliability Estimation ◽

Self Control ◽

Error Sources ◽

Analysis Of Error

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Analysis of Error Sources in STEP Astrometrytwo

Chinese Astronomy and Astrophysics ◽

10.1016/j.chinastron.2018.10.004 ◽

2018 ◽

Vol 42 (4) ◽

pp. 594-608

Author(s):

Liu Shu-yu ◽

Liu Jia-cheng ◽

Zhu Zi

Keyword(s):

Error Sources ◽

Analysis Of Error

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Lower Stratospheric Temperatures from CHAMP RO Compared to MSU/AMSU Records: An Analysis of Error Sources

New Horizons in Occultation Research ◽

10.1007/978-3-642-00321-9_18 ◽

2009 ◽

pp. 219-234 ◽

Author(s):

A.K. Steiner ◽

G. Kirchengast ◽

M. Borsche ◽

U. Foelsche

Keyword(s):

Error Sources ◽

Analysis Of Error

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Analysis of Error Sources in On-Wafer Noise Characterization of RF CMOS Transistors

10.1063/1.2036847 ◽

2005 ◽

Author(s):

Wojciech Wiatr

Keyword(s):

Rf Cmos ◽

Error Sources ◽

Cmos Transistors ◽

Noise Characterization ◽

Analysis Of Error

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Matching multiple-feature CD response from exposure tools: analysis of error sources with their impact in low-k1 regime

Optical Microlithography XVIII ◽

10.1117/12.602092 ◽

2005 ◽

Author(s):

Jo Finders ◽

Mircea Dusa

Keyword(s):

Error Sources ◽

Multiple Feature ◽

Analysis Of Error

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