Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs against Proton Radiation

Author(s):  
Mohammadreza Rezaei ◽  
Guillaume Hubert ◽  
Pedro Martin-Holgado ◽  
Yolanda Morilla ◽  
Juan Carlos Fabero ◽  
...  
2012 ◽  
Vol 61 (9) ◽  
pp. 1256-1269 ◽  
Author(s):  
Jae-Beom Lee ◽  
Myoung-Jin Kim ◽  
Sungroh Yoon ◽  
Eui-Young Chung

Sign in / Sign up

Export Citation Format

Share Document