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X‐ray characterization of (Zn,Cd)Te/CdTe strained layer superlattices
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
◽
10.1116/1.577555
◽
1991
◽
Vol 9
(3)
◽
pp. 954-956
Author(s):
Syed B. Qadri
Keyword(s):
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
Download Full-text
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References
X‐ray characterization of strain relaxation in InGaAs/GaAs strained‐layer superlattices
Applied Physics Letters
◽
10.1063/1.110190
◽
1993
◽
Vol 63
(24)
◽
pp. 3327-3329
◽
Cited By ~ 4
Author(s):
Jianhua Li
◽
Zhenhong Mai
◽
Shufan Cui
◽
Junming Zhou
◽
Wei Feng
Keyword(s):
Strain Relaxation
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
Download Full-text
Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices
Ultramicroscopy
◽
10.1016/0304-3991(91)90129-t
◽
1991
◽
Vol 36
(4)
◽
pp. 375-384
◽
Cited By ~ 13
Author(s):
X.F. Duan
◽
K.K. Fung
Keyword(s):
Electron Diffraction
◽
Convergent Beam Electron Diffraction
◽
X Ray Diffraction
◽
Beam Electron
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
◽
Convergent Beam
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X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices
Journal of Applied Physics
◽
10.1063/1.342005
◽
1988
◽
Vol 64
(12)
◽
pp. 6733-6745
◽
Cited By ~ 44
Author(s):
A. T. Macrander
◽
G. P. Schwartz
◽
G. J. Gualtieri
Keyword(s):
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
◽
Raman Characterization
Download Full-text
Characterization of InxGa1−xAs/GaAs strained layer superlattices by ion backscattering-channeling and X-ray diffraction
phys stat sol (a)
◽
10.1002/pssa.2211070151
◽
1988
◽
Vol 107
(1)
◽
pp. K19-K24
◽
Cited By ~ 7
Author(s):
R. Flagmeyer
◽
K. Lenkeit
◽
T. Baumbach
◽
Yu. O. Kanter
◽
A. A. Fedorov
Keyword(s):
X Ray Diffraction
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
◽
Ion Backscattering
Download Full-text
Characterization of Anomalous Lattice-Relaxation Process in InAsP/InGaAsP Strained Layer Superlattices by X-Ray Diffraction Measurements
InP and Related Compounds
◽
10.1201/9781482282986-18
◽
2000
◽
pp. 525-580
Keyword(s):
Relaxation Process
◽
Lattice Relaxation
◽
X Ray Diffraction
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
Download Full-text
Erratum: ‘‘X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices’’ [J. Appl. Phys. 64, 6733 (1988)]
Journal of Applied Physics
◽
10.1063/1.344504
◽
1989
◽
Vol 66
(8)
◽
pp. 3963-3963
Author(s):
A. T. Macrander
◽
G. P. Schwartz
◽
G. J. Gualtieri
Keyword(s):
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
◽
Raman Characterization
Download Full-text
Molecular‐beam epitaxial growth and x‐ray characterization of (Zn,Cd)Te/CdTe strained layer superlattices
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
◽
10.1116/1.575898
◽
1989
◽
Vol 7
(3)
◽
pp. 616-620
◽
Cited By ~ 11
Author(s):
T. D. Golding
◽
S. B. Qadri
◽
J. H. Dinan
Keyword(s):
Epitaxial Growth
◽
Molecular Beam
◽
X Ray
◽
Strained Layer
◽
Molecular Beam Epitaxial
◽
Molecular Beam Epitaxial Growth
◽
Strained Layer Superlattices
Download Full-text
Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction
Journal of Crystal Growth
◽
10.1016/0022-0248(94)90099-x
◽
1994
◽
Vol 141
(1-2)
◽
pp. 103-108
Author(s):
X.F. Duan
◽
K.K. Fung
◽
Y.M. Chu
Keyword(s):
Strain State
◽
X Ray Diffraction
◽
Double Crystal
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
Download Full-text
Kinematical simulation of high‐resolution x‐ray diffraction curves of GexSi1−x/Si strained‐layer superlattices: A structural assessment
Applied Physics Letters
◽
10.1063/1.99189
◽
1988
◽
Vol 52
(14)
◽
pp. 1152-1154
◽
Cited By ~ 29
Author(s):
J. M. Vandenberg
◽
J. C. Bean
◽
R. A. Hamm
◽
R. Hull
Keyword(s):
High Resolution
◽
X Ray Diffraction
◽
Structural Assessment
◽
X Ray
◽
Strained Layer
◽
Strained Layer Superlattices
◽
Kinematical Simulation
Download Full-text
Characterization of the interface of ZnSe-ZnS strained-layer superlattices by MeV transmission electron microscopy and ion-channeling
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
◽
10.1016/0168-583x(88)90640-4
◽
1988
◽
Vol 33
(1-4)
◽
pp. 603-606
◽
Cited By ~ 10
Author(s):
Kawakami Yoichi
◽
Taguchi Tsunemasa
◽
Satou Mamoru
◽
Hiraki Akio
Keyword(s):
Electron Microscopy
◽
Transmission Electron Microscopy
◽
Strained Layer
◽
Ion Channeling
◽
Transmission Electron
◽
Strained Layer Superlattices
Download Full-text
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