Characterization and correction of optical proximity effects in deep-ultraviolet lithography using behavior modeling
1996 ◽
Vol 14
(6)
◽
pp. 4175
◽
1998 ◽
Vol 37
(Part 1, No. 2)
◽
pp. 571-576
◽
1990 ◽
Vol 8
(6)
◽
pp. 1740
◽
1993 ◽
Vol 11
(6)
◽
pp. 2789
◽
2000 ◽
Vol 39
(Part 1, No. 2A)
◽
pp. 669-674
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