Broadband spectrographic method for precision alignment of compression gratings

2016 ◽  
Vol 55 (8) ◽  
pp. 086105 ◽  
Author(s):  
Shuai Li ◽  
Zhaoyang Li ◽  
Cheng Wang ◽  
Yi Xu ◽  
Yanyan Li ◽  
...  
1975 ◽  
Vol 22 (1) ◽  
pp. 69-76 ◽  
Author(s):  
Ching-Ning Chao ◽  
Shirley Lam Lee ◽  
Hui-Tuh Tsai ◽  
Shaw-Chii Wu

2013 ◽  
Vol 5 (18) ◽  
pp. 4602 ◽  
Author(s):  
Yanjuan Tang ◽  
Guimin Sun ◽  
Jiye Cai ◽  
Peihui Yang

1976 ◽  
Vol 30 (3) ◽  
pp. 335-343 ◽  
Author(s):  
Isaac B. Brenner ◽  
L. Gleit ◽  
A. Harel

A cooperative investigation has been performed to test long-term interlaboratory and interinstrumental accuracy and precision of a dc carbon arc optical emission spectrographic method for determining the common trace and minor elements in silicate rocks and minerals. Comparisons are made with determinations by atomic absorption and X-ray fluorescence spectrometric procedures to indicate agreement or bias of the analytical results, and the presence of systematic errors.


1970 ◽  
Vol 50 (2) ◽  
pp. 237-242 ◽  
Author(s):  
R.K. Dhumwad ◽  
M.V. Joshi ◽  
A.B. Patwardhan

1967 ◽  
Vol 21 (2) ◽  
pp. 86-88 ◽  
Author(s):  
Roy Ko

A total-burn spectrographic method has been applied to the determination of trace concentrations of silicon in plutonium. The sample is oxidized to plutonium dioxide, mixed with a germanium dioxide—graphite mixture containing tin internal standard, packed into cupped graphite electrodes, and burned to completion in a high-amperage dc arc. Plutonium spectral interference is avoided by using the less sensitive Si 2506.90-Å line. The lower limit of the determination is 25 ppm of silicon in plutonium. The precision of the method is estimated to be ±8% (coefficient of variation) at the 270-ppm level and ±14% at 40 ppm.


1952 ◽  
Vol 24 (12) ◽  
pp. 1921-1925 ◽  
Author(s):  
C. W. Key ◽  
G. D. Hoggan

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