Interface absorption versus film absorption in HfO2SiO2thin-film pairs in the near-ultraviolet and the relation to pulsed-laser damage

Author(s):  
S. Papernov ◽  
A. A. Kozlov ◽  
J. B. Oliver
2016 ◽  
Vol 56 (1) ◽  
pp. 011004 ◽  
Author(s):  
Semyon Papernov ◽  
Alexei A. Kozlov ◽  
James B. Oliver ◽  
Chris Smith ◽  
Lars Jensen ◽  
...  

1975 ◽  
Vol 7 (3) ◽  
pp. 215-226 ◽  
Author(s):  
B. Luther-Davies ◽  
R. C. Smith ◽  
R. Wyatt
Keyword(s):  

2018 ◽  
Vol 45 (1) ◽  
pp. 0104002
Author(s):  
单翀 Shan Chong ◽  
赵元安 Zhao Yuan′an ◽  
张喜和 Zhang Xihe ◽  
胡国行 Hu Guohang ◽  
王岳亮 Wang Yueliang ◽  
...  

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