Reliability and degradation mechanisms in high-power broad-area lasers with strained InGaAs-AlGaAs QW and InAs-GaAs QD active regions

Author(s):  
Yongkun Sin ◽  
Stephen LaLumondiere ◽  
Neil Ives
2018 ◽  
Vol 11 (3) ◽  
pp. 032702 ◽  
Author(s):  
Zefeng Lu ◽  
Lijie Wang ◽  
Yu Zhang ◽  
Shili Shu ◽  
Sicong Tian ◽  
...  

2012 ◽  
Vol 100 (20) ◽  
pp. 201115 ◽  
Author(s):  
C. M. Schultz ◽  
P. Crump ◽  
A. Maaßdorf ◽  
O. Brox ◽  
F. Bugge ◽  
...  

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Seval Arslan ◽  
Götz Erbert ◽  
Pietro Della Casa ◽  
Dominik Martin ◽  
...  

2005 ◽  
Author(s):  
Andreas Klehr ◽  
M. Braun ◽  
Frank Bugge ◽  
Goetz Erbert ◽  
J. Fricke ◽  
...  

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