High-resolution x-ray spectroscopy with the reflection grating spectrometer of Constellation-X

2006 ◽  
Author(s):  
Eric Schindhelm ◽  
Nahum Arav ◽  
Webster Cash
2001 ◽  
Vol 365 (1) ◽  
pp. L312-L317 ◽  
Author(s):  
S. M. Kahn ◽  
M. A. Leutenegger ◽  
J. Cottam ◽  
G. Rauw ◽  
J.-M. Vreux ◽  
...  

1984 ◽  
Vol 86 ◽  
pp. 84-87
Author(s):  
M. Lampton ◽  
M.C Hettrick ◽  
S. Bowyer

Spectroscopic analysis is a powerful technique for the diagnosis of temperatures and compositions of astrophysical plasmas. The EUV (100–1000Å) and soft x-ray (10–100Å) bands contain hundreds of potentially useful diagnostic lines. Unfortunately, traditional types of grating spectrometer become inefficient or unwieldy when adapted to stellar spectroscopy onboard a spacecraft. At grazing incidence, the required length of a high-resolution plane-grating spectrometer can easily exceed the length of the telescope feeding it. For these reasons, we have systematically explored ways to introduce a reflection grating into the converging beam formed by a given objective optical system ahead of its first focus. A spectrometer of this type results in an optical train no longer than the telescope’s existing prime-focus beam.


1994 ◽  
Author(s):  
Jay V. Bixler ◽  
Henry J. M. Aarts ◽  
Wolfgang Burkert ◽  
Antonius J. F. den Boggende ◽  
Graziella Branduardi-Raymont ◽  
...  

1989 ◽  
Author(s):  
Fred A. Jansen ◽  
Marc Heppener ◽  
Henry J. Aarts ◽  
Piet A. de Korte

2014 ◽  
Author(s):  
R. K. Smith ◽  
M. Ackermann ◽  
R. Allured ◽  
M. W. Bautz ◽  
J. Bregman ◽  
...  

1994 ◽  
Author(s):  
Jan-Willem den Herder ◽  
Henry J. M. Aarts ◽  
Marcel L. van den Berg ◽  
Jay V. Bixler ◽  
Antonius J. F. den Boggende ◽  
...  

2004 ◽  
Vol 75 (10) ◽  
pp. 3723-3726 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
E. Träbert ◽  
H. Chen ◽  
J. K. Lepson ◽  
...  

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