Spectral statistics in damped systems: Diffuse field decay curvature for materials characterization

1997 ◽  
Vol 102 (4) ◽  
pp. 2113-2116 ◽  
Author(s):  
John Burkhardt
Keyword(s):  
Materials Characterization ◽  
Spectral Statistics ◽  
Field Decay ◽  
Damped Systems

Spectral statistics in damped systems. Part I. Modal decay rate statistics

1996 ◽  
Vol 100 (1) ◽  
pp. 320-326 ◽  
Author(s):  
John Burkhardt ◽  
Richard L. Weaver
Keyword(s):  
Decay Rate ◽  
Spectral Statistics ◽  
Damped Systems

Elemental Distribution in Pt-Re:Al2O3 Naphtha Reforming Catalysts

1980 ◽  
Vol 38 ◽  
pp. 200-201
Author(s):  
R. L. Freed ◽  
M. J. Kelley
Keyword(s):  
Bimetallic Catalyst ◽  
Supported Catalysts ◽  
Coke Formation ◽  
Materials Characterization ◽  
Metal Catalyst ◽  
Elemental Distribution ◽  
Exact Nature ◽  
Naphtha Reforming ◽  
Reforming Catalysts ◽  
Commercial Introduction

The commercial introduction of Pt-Re supported catalysts to replace Pt alone on Al2O3 has brought improvements to naphtha reforming. The bimetallic catalyst can be operated continuously under conditions which lead to deactivation of the single metal catalyst by coke formation. Much disagreement still exists as to the exact nature of the bimetallic catalyst at a microscopic level and how it functions in the process so successfully. The overall purpose of this study was to develop the materials characterization tools necessary to study supported catalysts. Specifically with the Pt-Re:Al2O3 catalyst, we sought to elucidate the elemental distribution on the catalyst.

Nonbaseband residual flexibility method of component mode synthesis for proportionally damped systems

AIAA Journal ◽  
1999 ◽  
Vol 37 ◽  
pp. 1285-1291
Author(s):  
Jeffrey A. Morgan ◽  
Christophe Pierre ◽  
Gregory M. Hulbert
Keyword(s):  
Component Mode Synthesis ◽  
Damped Systems

Nanomechanical Characterization in the FIB

2005 ◽  
Author(s):  
Thomas M. Moore
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Materials Characterization ◽  
Depth Of Focus ◽  
Ion Milling ◽  
Nano Technology ◽  
Physical Behavior ◽  
Nanomechanical Testing ◽  
Load Cells ◽  
Scanning Electron

Abstract The availability of the focused ion beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability has made it an appealing platform for materials characterization at the sub-micron, or "nano" level. This article focuses on nanomechanical characterization in the FIB, which is an extension of the FIB capabilities into the realm of nano-technology. It presents examples that demonstrate the power and flexibility of nanomechanical testing in the FIB or scanning electron microscope with a probe shaft that includes a built-in strain gauge. Loads that range from grams to micrograms are achievable. Calibration is limited only by the availability of calibrated load cells in the smallest load ranges. Deflections in the range of a few nanometers range can be accurately applied. Simultaneous electrical, mechanical, and visual data can be combined to provide a revealing study of physical behavior of complex and dynamic nanostructures.

scholarly journals Novel nuclear materials characterization workflows enabled by fs-laser milling

2021 ◽  
Vol 27 (S1) ◽  
pp. 3086-3087
Author(s):  
Stephen Kelly ◽  
Robin White ◽  
Tobias Volkenandt ◽  
William Harris ◽  
Benjamin Tordoff ◽  
...  
Keyword(s):  
Materials Characterization ◽  
Nuclear Materials ◽  
Laser Milling ◽  
Fs Laser
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