Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation

2016 ◽  
Vol 79 (14) ◽  
pp. 1571-1576 ◽  
Author(s):  
M. A. Petukhov ◽  
A. I. Ryazanov
Keyword(s):  
Charge Trapping ◽  
Ionizing Irradiation ◽  
Mos Devices ◽  
Radiation Induced ◽  
Induced Charge

Bias and frequency dependence of radiation-induced-charge trapping in MOS devices

2001 ◽  
Vol 48 (6) ◽  
pp. 2114-2120 ◽  
Author(s):  
J.A. Felix ◽  
D.M. Fleetwood ◽  
L.C. Riewe ◽  
M.R. Shaneyfelt ◽  
P.S. Winokur
Keyword(s):  
Frequency Dependence ◽  
Charge Trapping ◽  
Mos Devices ◽  
Radiation Induced ◽  
Induced Charge

Effect of radiation-induced charge on 1/f noise in MOS devices

1990 ◽  
Vol 37 (6) ◽  
pp. 1696-1702 ◽  
Author(s):  
T.L. Meisenheimer ◽  
D.M. Fleetwood
Keyword(s):  
Mos Devices ◽  
Radiation Induced ◽  
Induced Charge

Radiation Induced Charge Trapping in Ultrathin ${\rm HfO}_{2}$-Based MOSFETs

2007 ◽  
Vol 54 (6) ◽  
pp. 1883-1890 ◽  
Author(s):  
Sriram K. Dixit ◽  
Xing J. Zhou ◽  
Ronald D. Schrimpf ◽  
Daniel M. Fleetwood ◽  
Sokrates T. Pantelides ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Radiation Induced ◽  
Induced Charge

Radiation‐induced charge trapping in implanted buried oxides

1990 ◽  
Vol 68 (12) ◽  
pp. 6143-6148 ◽  
Author(s):  
Frederick T. Brady ◽  
Sheng S. Li ◽  
Wade A. Krull
Keyword(s):  
Charge Trapping ◽  
Radiation Induced ◽  
Induced Charge

Electron trapping by radiation‐induced charge in MOS devices

1976 ◽  
Vol 47 (3) ◽  
pp. 1196-1198 ◽  
Author(s):  
J. M. Aitken ◽  
D. R. Young
Keyword(s):  
Electron Trapping ◽  
Mos Devices ◽  
Radiation Induced ◽  
Induced Charge

Radiation-Induced Charge Trapping and Low-Frequency Noise of Graphene Transistors

2018 ◽  
Vol 65 (1) ◽  
pp. 156-163 ◽  
Author(s):  
P. Wang ◽  
C. Perini ◽  
A. O'Hara ◽  
B. R. Tuttle ◽  
E. X. Zhang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Charge Trapping ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Radiation Induced ◽  
Induced Charge

Modelling of radiation-induced charge trapping at the Si*SiO2 interface of MOS structures

1993 ◽  
Vol 140 (1) ◽  
pp. 163-171 ◽  
Author(s):  
Yu. D. Tkachev ◽  
V. S. Lysenko ◽  
V. I. Turchanikov
Keyword(s):  
Charge Trapping ◽  
Radiation Induced ◽  
Induced Charge ◽  
Mos Structures

Electrical bias stressing and radiation induced charge trapping in HfO2/SiO2 dielectric stacks

2007 ◽  
Vol 101 (10) ◽  
pp. 104101 ◽  
Author(s):  
R. A. B Devine ◽  
T. Busani ◽  
Manuel Quevedo-Lopez ◽  
H. N. Alshareef
Keyword(s):  
Charge Trapping ◽  
Radiation Induced ◽  
Induced Charge ◽  
Electrical Bias
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