Application of Double Resonance Sum Frequency Generation Spectroscopy to Characterize the Interfacial Electronic and Molecular Structure in Electrochemical Environment

2017 ◽  
Vol 19 (25) ◽  
pp. 16875-16880 ◽  
Author(s):  
Jan Schaefer ◽  
Grazia Gonella ◽  
Mischa Bonn ◽  
Ellen H. G. Backus

Surface-specific vibrational sum-frequency generation spectroscopy (V-SFG) is used to obtain information about the molecular structure at charged interfaces.


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