The diffraction experiment in the study of solid solutions

Author(s):  
Pierre Moine

Qualitatively, amorphous structures can be easily revealed and differentiated from crystalline phases by their Transmission Electron Microscopy (TEM) images and their diffraction patterns (fig.1 and 2) but, for quantitative structural information, electron diffraction pattern intensity analyses are necessary. The parameters describing the structure of an amorphous specimen have been introduced in the context of scattering experiments which have been, so far, the most used techniques to obtain structural information in the form of statistical averages. When only small amorphous volumes (< 1/μm in size or thickness) are available, the much higher scattering of electrons (compared to neutrons or x rays) makes, despite its drawbacks, electron diffraction extremely valuable and often the only feasible technique.In a diffraction experiment, the intensity IN (Q) of a radiation, elastically scattered by N atoms of a sample, is measured and related to the atomic structure, using the fundamental relation (Born approximation) : IN(Q) = |FT[U(r)]|.


1989 ◽  
Vol 50 (21) ◽  
pp. 3223-3232 ◽  
Author(s):  
G. Le Bastard ◽  
R. Granger ◽  
S. Rolland ◽  
Y. Marqueton ◽  
R. Triboulet

1979 ◽  
Vol 40 (C5) ◽  
pp. C5-314-C5-320 ◽  
Author(s):  
F. Holtzberg ◽  
T. Penney ◽  
R. Tournier
Keyword(s):  

1976 ◽  
Vol 37 (C7) ◽  
pp. C7-204-C7-207
Author(s):  
G. BACQUET ◽  
C. BOUYSSET ◽  
D. HERNANDEZ
Keyword(s):  

1985 ◽  
Vol 46 (C7) ◽  
pp. C7-173-C7-177 ◽  
Author(s):  
S. Permogorov ◽  
A. Reznitsky ◽  
S. Verbin ◽  
A. Naumov ◽  
W. von der Osten ◽  
...  

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