Speckle Metrology for Microsystem Inspection

Author(s):  
Petra Aswendt ◽  
Roland Höfling
Keyword(s):  
1984 ◽  
Vol 13 (2) ◽  
pp. 53-57
Author(s):  
Chandra Shakher ◽  
G. Venkata Rao
Keyword(s):  

2020 ◽  
pp. 473-506
Author(s):  
Chandra Shakher
Keyword(s):  

2011 ◽  
Author(s):  
Ichirou Yamaguchi ◽  
Koichi Kobayashi
Keyword(s):  

Author(s):  
G. R. Gaudette ◽  
E. U. Azeloglu ◽  
J. Todaro ◽  
L. Keene ◽  
I. B. Krukenkamp ◽  
...  

1985 ◽  
Author(s):  
D. R. Matthys ◽  
T. D. Dudderar ◽  
J. A. Gilbert ◽  
M. A. Taher ◽  
H. S. Johnson

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