speckle metrology
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Dynamic Speckle Metrology with Normalized Processing of Compressed Data

2021 ◽  
Author(s):  
Elena Stoykova ◽  
Dimana Nazarova ◽  
Lian Nedelchev ◽  
Branimir Ivanov ◽  
Alexander Machikhin
Keyword(s):  
Dynamic Speckle ◽  
Speckle Metrology ◽  
Compressed Data

Automatic Fringe Analysis Procedures in Speckle Metrology

2020 ◽  
pp. 427-472
Author(s):  
G. H. Kaufmann
Keyword(s):  
Fringe Analysis ◽  
Speckle Metrology

Techniques of Displacement and Deformation Measurements in Speckle Metrology

2020 ◽  
pp. 41-98
Author(s):  
Pramod K. Rastogi
Keyword(s):  
Speckle Metrology ◽  
Deformation Measurements

Speckle Metrology Using Hololenses

2020 ◽  
pp. 473-506
Author(s):  
Chandra Shakher
Keyword(s):  
Speckle Metrology

White Light Speckle Metrology

2020 ◽  
pp. 325-372
Author(s):  
Anand K. Asundi
Keyword(s):  
White Light ◽  
Speckle Metrology

Speckle Metrology

2020 ◽  
Author(s):  
R.S. Sirohi
Keyword(s):  
Speckle Metrology

Novel Applications of Speckle Metrology

2020 ◽  
pp. 195-234
Author(s):  
Chandra S. Vikram
Keyword(s):  
Speckle Metrology ◽  
Novel Applications

Wavelets Teager–Kaiser Hilbert approach for AM–FM signal demodulation: application in the field of speckle metrology

2020 ◽  
Vol 59 (10) ◽  
pp. 1 ◽  
Author(s):  
Desire Muhire ◽  
Yassine Tounsi ◽  
Manoj Kumar ◽  
Ahmed Siari ◽  
Fernando Mendoza-Santoyo ◽  
...  
Keyword(s):  
Signal Demodulation ◽  
Speckle Metrology

Coarse Quantization in Dynamic Speckle Metrology at Non-uniform Illumination

2020 ◽  
Author(s):  
Elena Stoykova ◽  
Dimana Nazarova ◽  
Lian Nedelchev ◽  
Kwan-Jung Oh ◽  
Joongki Park
Keyword(s):  
Uniform Illumination ◽  
Dynamic Speckle ◽  
Speckle Metrology ◽  
Coarse Quantization

Speckle Metrology for Microsystem Inspection

2019 ◽  
pp. 485-515
Author(s):  
Roland Höfling ◽  
Petra Aswendt
Keyword(s):  
Speckle Metrology
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