Phase stepping through polarizing modulation in electronic speckle pattern interferometry

Gustavo A. Gómez-Méndez; Gustavo Rodríguez-Zurita; Amalia Martínez-García; Yukitoshi Otani; David I. Serrano-García; Luis García-Lechuga; Noel Ivan Toto-Arellano

doi:10.1364/ao.397137

Phase stepping through polarizing modulation in electronic speckle pattern interferometry

Applied Optics ◽

10.1364/ao.397137 ◽

2020 ◽

Vol 59 (20) ◽

pp. 6005

Author(s):

Gustavo A. Gómez-Méndez ◽

Gustavo Rodríguez-Zurita ◽

Amalia Martínez-García ◽

Yukitoshi Otani ◽

David I. Serrano-García ◽

...

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Phase Stepping

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A quarter-wave phase-stepping algorithm for fiber-optic electronic speckle pattern interferometry using zero-crossing triggers

IEEE Photonics Technology Letters ◽

10.1109/lpt.2006.879947 ◽

2006 ◽

Vol 18 (16) ◽

pp. 1732-1734 ◽

Cited By ~ 4

Author(s):

Hyoung-Jun Park ◽

Minho Song

Keyword(s):

Fiber Optic ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Zero Crossing ◽

Wave Phase ◽

Phase Stepping ◽

Quarter Wave

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Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Applied Optics ◽

10.1364/ao.38.005944 ◽

1999 ◽

Vol 38 (28) ◽

pp. 5944 ◽

Cited By ~ 32

Author(s):

Bernardino Barrientos García ◽

Andrew J. Moore ◽

Carlos Pérez-López ◽

Lingli Wang ◽

Theo Tschudi

Keyword(s):

Speckle Pattern ◽

Optical Element ◽

Deformation Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Spatial Phase ◽

Transient Deformation ◽

Phase Stepping ◽

Holographic Optical Element

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Self-marking phase-stepping electronic speckle pattern interferometry (ESPI) for determining a phase map with least residues

Optics & Laser Technology ◽

10.1016/j.optlastec.2005.04.008 ◽

2007 ◽

Vol 39 (1) ◽

pp. 136-148 ◽

Cited By ~ 6

Author(s):

M.J. Huang ◽

Bo-Son Yun

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Phase Stepping ◽

Phase Map

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Three-step electronic speckle pattern interferometry method with arbitrary phase shifts of reference wave

Information extraction and processing ◽

10.15407/vidbir2019.47.054 ◽

2019 ◽

Vol 2019 (47) ◽

pp. 54-58

Author(s):

L.I. Muravsky ◽

Keyword(s):

Speckle Pattern ◽

Phase Shifts ◽

Reference Wave ◽

Electronic Speckle Pattern Interferometry ◽

Arbitrary Phase ◽

Interferometry Method

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Measurement of In-Plane Strain with Shearography and Electronic Speckle Pattern Interferometry for Composite Materials

2014 International Symposium on Optomechatronic Technologies ◽

10.1109/isot.2014.52 ◽

2014 ◽

Author(s):

Amalia Martinez-Garcia ◽

Juan-Antonio Rayas-Alvarez ◽

Raul Cordero

Keyword(s):

Composite Materials ◽

Plane Strain ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry

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Electronic speckle pattern interferometry of residual stress measurement using hole-indentation method

10.1117/12.621936 ◽

2005 ◽

Author(s):

C. N. Sim ◽

Cho Jui Tay ◽

L. Cheng

Keyword(s):

Residual Stress ◽

Stress Measurement ◽

Speckle Pattern ◽

Residual Stress Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Indentation Method

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Thermal strain analysis of composite materials by electronic speckle pattern interferometry

KSME International Journal ◽

10.1007/bf03185649 ◽

2000 ◽

Vol 14 (5) ◽

pp. 477-482 ◽

Cited By ~ 1

Author(s):

Koung Suk Kim ◽

Wan Shik Jang ◽

Myung Seak Hong ◽

Ki Soo Kang ◽

Hyun Chul Jung ◽

...

Keyword(s):

Composite Materials ◽

Speckle Pattern ◽

Thermal Strain ◽

Strain Analysis ◽

Electronic Speckle Pattern Interferometry

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Stress-strain curves of flip-chip solder balls based on finite-element modeling of thermal displacements measured by electronic speckle pattern interferometry

Journal of Electronic Materials ◽

10.1007/s11664-003-0030-5 ◽

2003 ◽

Vol 32 (11) ◽

pp. 1322-1329 ◽

Cited By ~ 5

Author(s):

Baik-Woo Lee ◽

Ju-Young Kim ◽

Dongil Kwon

Keyword(s):

Finite Element ◽

Finite Element Modeling ◽

Flip Chip ◽

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Stress Strain ◽

Element Modeling ◽

Solder Balls ◽

Thermal Displacements

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Computer-aided electronic speckle pattern interferometry (ESPI). Deformation analysis by fringe manipulation

NDT International ◽

10.1016/0308-9126(88)90286-6 ◽

1988 ◽

Vol 21 (6) ◽

pp. 422-426 ◽

Cited By ~ 3

Author(s):

M. Owner-Petersen ◽

P.Damgaard Jensen

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Deformation Analysis ◽

Computer Aided

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Electronic speckle pattern interferometry

Physics in Technology ◽

10.1088/0305-4624/11/1/303 ◽

1980 ◽

Vol 11 (1) ◽

pp. 16-22 ◽

Cited By ~ 82

Author(s):

Ole Lekberg

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry

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