Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filtering

2011 ◽  
Author(s):  
Stefan E. Schausberger ◽  
Bettina Heise ◽  
Christian Maurer ◽  
Stefan Bernet ◽  
Monika Ritsch-Marte ◽  
...  
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Fourier Plane ◽  
Low Coherence

Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filtering

2011 ◽  
Author(s):  
Stefan E. Schausberger ◽  
Bettina Heise ◽  
Christian Maurer ◽  
Stefan Bernet ◽  
Monika Ritsch-Marte ◽  
...  
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Fourier Plane ◽  
Low Coherence

Flexible contrast for low-coherence interference microscopy by Fourier-plane filtering with a spatial light modulator

2010 ◽  
Vol 35 (24) ◽  
pp. 4154 ◽  
Author(s):  
Stefan E. Schausberger ◽  
Bettina Heise ◽  
Christian Maurer ◽  
Stefan Bernet ◽  
Monika Ritsch-Marte ◽  
...  
Keyword(s):  
Spatial Light Modulator ◽  
Interference Microscopy ◽  
Light Modulator ◽  
Fourier Plane ◽  
Low Coherence

scholarly journals High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms

2019 ◽  
Vol 27 (15) ◽  
pp. 20990 ◽  
Author(s):  
Michail Symeonidis ◽  
Radius N. S. Suryadharma ◽  
Rossella Grillo ◽  
Andreas Vetter ◽  
Carsten Rockstuhl ◽  
...  
Keyword(s):  
High Resolution ◽  
Spectral Resolution ◽  
Interference Microscopy ◽  
Self Assembled ◽  
Individual Particles

Flexible and high-resolution surface metrology based on stitching interference microscopy

2022 ◽  
Vol 151 ◽  
pp. 106915
Author(s):  
Shanyong Chen ◽  
Wenwen Lu ◽  
Jingyang Guo ◽  
Dede Zhai ◽  
Weiwei Chen
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Surface Metrology

scholarly journals High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy (Phys. Status Solidi A 13∕2019)

2019 ◽  
Vol 216 (13) ◽  
pp. 1970044
Author(s):  
Paul C. Montgomery ◽  
Sylvain Lecler ◽  
Audrey Leong‐Hoï ◽  
Stéphane Perrin
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Surface Metrology

scholarly journals Signal modeling in low coherence interference microscopy on example of rectangular grating

2016 ◽  
Vol 24 (13) ◽  
pp. 14283 ◽  
Author(s):  
Weichang Xie ◽  
Peter Lehmann ◽  
Jan Niehues ◽  
Stanislav Tereschenko
Keyword(s):  
Interference Microscopy ◽  
Signal Modeling ◽  
Low Coherence

Transparent layer thickness measurement using low-coherence interference microscopy

2015 ◽  
Author(s):  
P. Kühnhold ◽  
A. Nolvi ◽  
S. Tereschenko ◽  
I. Kassamakov ◽  
E. Hæggström ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Thickness Measurement ◽  
Interference Microscopy ◽  
Low Coherence ◽  
Transparent Layer
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