Flexible and high-resolution surface metrology based on stitching interference microscopy

2022 ◽  
Vol 151 ◽  
pp. 106915
Author(s):  
Shanyong Chen ◽  
Wenwen Lu ◽  
Jingyang Guo ◽  
Dede Zhai ◽  
Weiwei Chen
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Surface Metrology

scholarly journals High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy (Phys. Status Solidi A 13∕2019)

2019 ◽  
Vol 216 (13) ◽  
pp. 1970044
Author(s):  
Paul C. Montgomery ◽  
Sylvain Lecler ◽  
Audrey Leong‐Hoï ◽  
Stéphane Perrin
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Surface Metrology

High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy

2019 ◽  
Vol 216 (13) ◽  
pp. 1800761 ◽  
Author(s):  
Paul C. Montgomery ◽  
Sylvain Lecler ◽  
Audrey Leong‐Hoï ◽  
Stéphane Perrin
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Surface Metrology

scholarly journals High-resolution interference microscopy with spectral resolution for the characterization of individual particles and self-assembled meta-atoms

2019 ◽  
Vol 27 (15) ◽  
pp. 20990 ◽  
Author(s):  
Michail Symeonidis ◽  
Radius N. S. Suryadharma ◽  
Rossella Grillo ◽  
Andreas Vetter ◽  
Carsten Rockstuhl ◽  
...  
Keyword(s):  
High Resolution ◽  
Spectral Resolution ◽  
Interference Microscopy ◽  
Self Assembled ◽  
Individual Particles

New approach to the study of cell cytotoxicity using high-resolution coherence phase-interference microscopy

2020 ◽  
Author(s):  
Irina Vasilenko ◽  
Vladislav Metelin ◽  
Nataliya Kil’deeva ◽  
Andrey Temnov ◽  
Roman Lifenko ◽  
...  
Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Cell Cytotoxicity ◽  
New Approach ◽  
Phase Interference

Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filtering

2011 ◽  
Author(s):  
Stefan E. Schausberger ◽  
Bettina Heise ◽  
Christian Maurer ◽  
Stefan Bernet ◽  
Monika Ritsch-Marte ◽  
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Keyword(s):  
High Resolution ◽  
Interference Microscopy ◽  
Fourier Plane ◽  
Low Coherence

Wide-field high-resolution surface-plasmon interference microscopy

2009 ◽  
Vol 34 (20) ◽  
pp. 3110 ◽  
Author(s):  
Michael G. Somekh ◽  
Graham Stabler ◽  
Shugang Liu ◽  
Jing Zhang ◽  
Chung W. See
Keyword(s):  
High Resolution ◽  
Surface Plasmon ◽  
Interference Microscopy ◽  
Wide Field

scholarly journals Intensity and phase fields behind phase-shifting masks studied with high-resolution interference microscopy

2016 ◽  
Vol 15 (2) ◽  
pp. 021203
Author(s):  
Krishnaparvathy Puthankovilakam ◽  
Toralf Scharf ◽  
Myun Sik Kim ◽  
Ali Naqavi ◽  
Hans Peter Herzig ◽  
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Keyword(s):  
High Resolution ◽  
Phase Shifting ◽  
Interference Microscopy ◽  
Phase Fields
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