Joint enhancement and denoising in electronic speckle pattern interferometry fringe patterns with low contrast or uneven illumination via an oriented variational Retinex model

2021 ◽  
Author(s):  
Rui Han ◽  
Chen Tang ◽  
Min Xu ◽  
Jianming Li ◽  
Zhenkun Lei
Keyword(s):  
Speckle Pattern ◽  
Electronic Speckle Pattern Interferometry ◽  
Low Contrast ◽  
Fringe Patterns

Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry

2013 ◽  
Vol 770 ◽  
pp. 267-271
Author(s):  
Yun Wan ◽  
Ping Zhao ◽  
Sheng Fu Cui ◽  
Yin Fei Yang ◽  
Liang Li
Keyword(s):  
Measurement Method ◽  
Stress Measurement ◽  
Speckle Pattern ◽  
Engineering Application ◽  
Fem Analysis ◽  
Laser Beams ◽  
Electronic Speckle Pattern Interferometry ◽  
Measuring Device ◽  
Simulation Results ◽  
Fringe Patterns

A micro-displacement, strain and stress measurement method based on electronic speckle pattern interferometry (ESPI) technique is proposed, and the measuring device is designed. Two symmetric laser beams are illuminated on the optical rough surface of a steel cantilever beam, and then speckle images are photographed by CCD. A series of filtering processing is carried out for subtracted images and FEM analysis is performed. Using the speckle fringe patterns finally achieved, displacement, strain and stress can be calculated. By comparing displacement, strain and stress measured by this method with simulation results, feasibility and engineering application value of this method have been proved.

A novel method to obtain electronic speckle pattern interferometry fringe patterns with high contrast

2009 ◽  
Vol 7 (9) ◽  
pp. 788-790 ◽  
Author(s):  
李孟委 Mengwei Li ◽  
唐晨 Chen Tang ◽  
王高 Gao Wang ◽  
任宏伟 Hongwei Ren ◽  
唐科 Ke Tang ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Electronic Speckle Pattern Interferometry ◽  
High Contrast ◽  
Novel Method ◽  
Fringe Patterns

Research of Filtering Method for ESPI Fringe Patterns

2011 ◽  
Vol 403-408 ◽  
pp. 3195-3198 ◽  
Author(s):  
Yong Hong Wang ◽  
Hua Long Zhou ◽  
Nan Li ◽  
Lian Xiang Yang
Keyword(s):  
Image Processing ◽  
Fringe Pattern ◽  
Speckle Pattern ◽  
Experimental Results ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry ◽  
Phase Pattern ◽  
Traditional Methods ◽  
Filtering Method ◽  
Fringe Patterns

The Electronic Speckle Pattern Interferometry (ESPI) is a widely used technique for measurement displacement and deformation. But the fringe phase pattern of ESPI always comes with large noise when using phase-shifting technique. In order to ensure the accuracy of the measurement, it is very important to eliminate the noise of the phase fringe pattern. This paper introduced a phase filtering method, comparing with traditional methods, which can be found is a simple and effective method, and the experimental results have shown that the method was feasible used for image processing of ESPI fringes．

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