scholarly journals Studies on Surface and Interface with X-ray Absorption Fine Structure (XAFS). Application of XAFS Measurements to the Study of Semiconductors.

Hyomen Kagaku ◽  
2002 ◽  
Vol 23 (6) ◽  
pp. 367-373
Author(s):  
Hironori OFUCHI ◽  
Masao TABUCHI ◽  
Yoshikazu TAKEDA
Keyword(s):  
Fine Structure ◽  
X Ray ◽  
Surface And Interface ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Studies on Surface and Interface with X-ray Absorption Fine Structure (XAFS). Time Resolved XAFS Studies for Catalysts Preparation.

Hyomen Kagaku ◽  
2002 ◽  
Vol 23 (6) ◽  
pp. 339-344 ◽  
Author(s):  
Takafumi SHIDO ◽  
Aritomo YAMAGUCHI ◽  
Akane SUZUKI ◽  
Yasuhiro INADA ◽  
Kiyotaka ASAKURA ◽  
...  
Keyword(s):  
Fine Structure ◽  
Time Resolved ◽  
X Ray ◽  
Surface And Interface ◽  
Absorption Fine ◽  
Catalysts Preparation ◽  
X Ray Absorption

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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