Atomic Structure of The α-A12O3(0001)(√31×31)R±9° Reconstruction

1993 ◽  
Vol 312 ◽  
Author(s):  
G. Renaud ◽  
B. Villette
Keyword(s):  
Surface Structure ◽  
Correlation Length ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lower Temperature

AbstractThe atomic structure of the α-A12O3 (0001)(√31×√31)R±9° reconstruction has been solved by Grazing Incidence X-ray Diffraction. The surface structure is found to be perfectly commensurable with the underlying bulk lattice, with exponential correlation length ∼500 Å. It consists of hexagonal zones of two nearly perfect closed-packed Al(111) planes, separated by a defect of hexagonal periodicity with parameter 26.5 Å. This structure may explain why the reconstruction can be obtained at lower temperature by deposition of a few aluminum layers, and why Al/Al2O3 multilayers remain coherent, with aluminum of (111) orientation.

Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction

2007 ◽  
Vol 556-557 ◽  
pp. 533-536
Author(s):  
M. Silly ◽  
H. Enriquez ◽  
J. Roy ◽  
M. D'Angelo ◽  
P. Soukiassian ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Surface Structure ◽  
Surface Reconstruction ◽  
Structure Determination ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Wires ◽  
Atomic Lines

In order to give experimental insights on the atomic structure of the Si atomic wires developing on the β-SiC(100) surface, we use synchrotron radiation-based x-ray diffraction at grazing incidence to study a network of such atomic lines in a 5x2 surface array. Our results lead to an accurate surface and sub-surface structure determination evidencing a structure in agreement with a two adlayer symmetric dimer reconstruction. This atomic structure is significantly different from the 3x2 surface structure, giving new insights on the Si atomic lines stability.

Atomic structure of the CdTe(001) C(2×2) reconstructed surface: A grazing incidence x‐ray diffraction study

1995 ◽  
Vol 67 (26) ◽  
pp. 3957-3959 ◽  
Author(s):  
M. B. Veron ◽  
M. Sauvage‐Simkin ◽  
V. H. Etgens ◽  
S. Tatarenko ◽  
H. A. Van Der Vegt ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surface

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

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