Characterization of Surface Defect Structure by Low Energy Electron Diffraction

1984 ◽  
Vol 41 ◽  
Author(s):  
J. F. Wendelken ◽  
G. -C. Wang ◽  
J. M. Pimbley ◽  
T. -M. Lu

AbstractLow energy electron diffraction is a surface sensitive tool which is most widely used for the determination of surface symmetries and equilibrium atomic positions. Experimental and theoretical advances made in the past five years make it possible now to use LEED also for the characterization of a wide variety of surface defect structures. In this paper a variety of experimental results involving analysis of diffracted electron beam shapes as a function of primary electron beam energy, adsorbate coverage, crystal tem-perature and ordering time are presented. These experimental results coupled with kinematic theory, allow the determination of step density, size and shape of reconstruction domains and overlayer islands, island size distribution in an overlayer during growth, and the mode of growth.

2003 ◽  
Vol 10 (06) ◽  
pp. 831-836 ◽  
Author(s):  
Z. X. YU ◽  
S. Y. TONG ◽  
SHIHONG XU ◽  
SIMON MA ◽  
HUASHENG WU

A quantitative structural determination of the Ga-polar 1×1 (0001) surface of GaN is performed by quantitative low energy electron diffraction (LEED). The global best-fit structure is obtained by a new frozen LEED approach connected to a simulated annealing algorithm. The global minimization frozen (GMF) LEED search finds that the ordered structure consists of 1 ML of Ga adatoms at atop sites above Ga-terminated bilayers. The Ga adatoms are bonded with a Ga–Ga bond length of 2.51 Å. The spacings within surface bilayers show a weak oscillatory trend, with the outmost bilayer thickness expanding to 0.72 Å and the next bilayer thickness contracting to 0.64 Å, compared to the bulk thickness of 0.65 Å. The interlayer spacing between the first and second bilayers is 1.89 Å, while the next interlayer spacing is 1.94 Å, compared to the bulk value of 1.95 Å. These results are compared with data from other theoretical and experimental studies.


1977 ◽  
Vol 38 (2) ◽  
pp. 387-395 ◽  
Author(s):  
B. J. Mrstik ◽  
R. Kaplan ◽  
T. L. Reinecke ◽  
M. Van Hove ◽  
S. Y. Tong

Sign in / Sign up

Export Citation Format

Share Document