Sunlight Spectrum Dispersion with the Aid of Internal Reflection

2014 ◽  
Vol 2014 (3) ◽  
pp. 1-10
Author(s):  
Sylwia Adamczewska ◽  
◽  
Lukasz Gałasiński ◽  
Lukasz Jaszczuk ◽  
Paweł Szczerba ◽  
...  
Keyword(s):  
Internal Reflection

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

Beam switching by nonlinear control of total internal reflection

1998 ◽  
Vol 45 (1) ◽  
pp. 179-192
Author(s):  
DAVID R. ROWLAND, WAGDY SAMIR, ROWLAND A.
Keyword(s):  
Nonlinear Control ◽  
Total Internal Reflection ◽  
Internal Reflection ◽  
Beam Switching

Comparison of sensitivity of the refractometric methods of frustrated total internal reflection and surface plasmon resonance

2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Total Internal Reflection ◽  
Resonance Method ◽  
Internal Reflection ◽  
Optical Methods ◽  
Thin Boundary Layer ◽  
Experimental Conditions ◽  
Frustrated Total Internal Reflection

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.

Achromatic Total Internal Reflection Prism in DLP Projection System

2019 ◽  
pp. 1279
Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Projection System

Achromatic Total Internal Reflection Prism in DLP Projection System

2019 ◽  
pp. 1279
Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Projection System
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