Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

Rydberg and the development of atomic spectroscopy (Centennial of J. R. Rydberg's paper on the laws governing atomic spectra)

1990 ◽  
Vol 160 (12) ◽  
pp. 141
Author(s):  
M.A. El'yashevich ◽  
N.G. Kembrovskaya ◽  
L.M. Tomil'chik
Keyword(s):  
Atomic Spectroscopy ◽  
Atomic Spectra

Lasers in atomic spectroscopy: Selected applications

1992 ◽  
Vol 45 (1) ◽  
pp. 1-35 ◽  
Author(s):  
Terry L. Thiem ◽  
Yong-Ill Lee ◽  
Joseph Sneddon
Keyword(s):  
Atomic Spectroscopy

Atomic spectroscopy in elemental analysis

2005 ◽  
Vol 60 (2) ◽  
pp. 191-192
Author(s):  
M. Cullen
Keyword(s):  
Elemental Analysis ◽  
Atomic Spectroscopy

Direct detection of evanescent electromagnetic waves at a planar dielectric surface by laser atomic spectroscopy

1997 ◽  
Vol 55 (3) ◽  
pp. 2406-2412 ◽  
Author(s):  
T. Matsudo ◽  
H. Hori ◽  
T. Inoue ◽  
H. Iwata ◽  
Y. Inoue ◽  
...  
Keyword(s):  
Electromagnetic Waves ◽  
Direct Detection ◽  
Dielectric Surface ◽  
Atomic Spectroscopy
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