scholarly journals Dynamic reliability sensitivity analysis for inter-story isolation structure under stochastic excitations

2020 ◽  
Vol 22 (4) ◽  
pp. 880-895
Author(s):  
Shangrong Zhang ◽  
Fanglan Liu ◽  
Jianqiang Xiao ◽  
Yuchen Hu ◽  
Hairui Deng
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