scholarly journals X-ray Fluorescence Analysis of Titanium Alloys using the Fundamental Parameter Method

1988 ◽  
Vol 52 (8) ◽  
pp. 797-802
Author(s):  
Shinji Itoh ◽  
Koichi Sato ◽  
Junji Takahashi ◽  
Haruno Okochi
Keyword(s):  
Titanium Alloys ◽  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Fundamental Parameter Method

scholarly journals X-ray Fluorescence Analysis of Titanium Alloys Using the Fundamental Parameter Method

1989 ◽  
Vol 30 (4) ◽  
pp. 283-290 ◽  
Author(s):  
Shinji Itoh ◽  
Koichi Sato ◽  
Junji Takahashi ◽  
Haruno Okochi
Keyword(s):  
Titanium Alloys ◽  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Fundamental Parameter Method

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

2005 ◽  
Vol 20 (2) ◽  
pp. 183-183
Author(s):  
Y. Kataoka ◽  
N. Kawahara ◽  
S. Hara ◽  
Y. Yamada ◽  
T. Matsuo ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray ◽  
Fundamental Parameter Method

X-Ray Fluorescence Analysis of Multi-Layer Thin Films

1985 ◽  
Vol 29 ◽  
pp. 395-402 ◽  
Author(s):  
T. C. Huang ◽  
W. Parrish
Keyword(s):  
Thin Films ◽  
Single Layer ◽  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Triple Layer ◽  
Layer Thin Film ◽  
Fundamental Parameter Method

AbstractThe characterization of multi-layer thin films by X-ray fluorescence using the fundamental parameter method and the LAMA-III program is described. Analyses of a double-layer FeMn/NiFe and two triple-layer NiFe/Cu/Cr and Cr/Cu/NiFe specimens show that the complex inter-layer absorption and secondary fluorescence effects were properly corrected. The compositions and thicknesses of all layers agreed to ±2% with corresponding single-layer films, a precisian comparable with bulk and single-layer thin film analyses.

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